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Pinning on a defect line: characterization of marginal disorder relevance and sharp asymptotics for the critical point shift

机译:固定缺陷线:描述边缘疾病   关键点转换的相关性和尖锐渐近性

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摘要

The effect of disorder for pinning models is a subject which has attractedmuch attention in theoretical physics and rigorous mathematical physics. Apeculiar point of interest is the question of coincidence of the quenched andannealed critical point for a small amount of disorder. The question has beenmathematically settled in most cases in the last few years, giving inparticular a rigorous validation of the Harris Criterion on disorder relevance.However, the marginal case, where the return probability exponent is equal to$1/2$, i.e. where the inter-arrival law of the renewal process is given by$K(n)=n^{-3/2}\phi(n)$ where $\phi$ is a slowly varying function, has been leftpartially open. In this paper, we give a complete answer to the question byproving a simple necessary and sufficient criterion on the return probabilityfor disorder relevance, which confirms earlier predictions from the literature.Moreover, we also provide sharp asymptotics on the critical point shift: in thecase of the pinning (or wetting) of a one dimensional simple random walk, theshift of the critical point satisfies the following high temperatureasymptotics $$ \lim_{\beta\rightarrow 0}\beta^2\log h_c(\beta)= - \frac{\pi}{2}. $$ Thisgives a rigorous proof to a claim of B. Derrida, V. Hakim and J. Vannimenus(Journal of Statistical Physics, 1992).
机译:无序对钉扎模型的影响是一个在理论物理学和严格的数学物理学中引起广泛关注的主题。特殊的兴趣点是淬灭和退火的临界点对少量疾病的重合性问题。在过去的几年中,这个问题在大多数情况下已经通过数学方式解决,尤其是对哈里斯准则中关于障碍相关性的严格验证。然而,在边际情况下,返回概率指数等于$ 1/2 $,即更新过程的到达定律由$ K(n)= n ^ {-3/2} \ phi(n)$给出,其中$ \ phi $是一个缓慢变化的函数,已经部分开放。在本文中,我们通过为疾病相关性的返回概率提供简单,必要和充分的标准,为问题提供了完整的答案,这证实了文献中的较早预测。此外,我们还提供了关于临界点移动的清晰渐近性:一维简单随机游动的固定(或润湿),临界点的移动满足以下高温渐近线$$ \ lim _ {\ beta \ rightarrow 0} \ beta ^ 2 \ log h_c(\ beta)=-\ frac {\ pi} {2}。 $$这为B. Derrida,V。Hakim和J. Vannimenus的主张提供了严格的证据(统计物理学杂志,1992年)。

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